The apparatus shall continue to oprtate as intended after the test. No degradation of performance or loss of function is allowed below a performance level specified by the manufacturer, when the apparatus is used as intended. In some cases the performance level may be replaced by a permissible loss of performance. During the test, degradation of performance is however allowed. No change of actual operating state or stored data is allowed. If the minimum performance level of the permissible performance loss is not specified by the manufacturer then either of these may be derived from the product description and documentation and what the user may reasonably expect from the apparatus if used as indended.

This performance criteria is generally applied during transient phenomena, like ESD and burst.